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Building upon two existing literatures concerning the
And Wisnioski, E. And Wuyts, S. And Bandara, K. Bensouiah, Djamel Abderrahmane (1992) Testability and redundancy techniques for improved yield and reliability of CMOS VLSI circuits. Doctoral thesis, Durham University.9MbAbstractThe research presented in this thesis is concerned with the design … Continue reading